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Study of the tunnelling initiated leakage current through the carbon nanotube embedded gate oxide in metal oxide semiconductor structures

✍ Scribed by Chakraborty, Gargi; Sarkar, C K; Lu, X B; Dai, J Y

Book ID: 120651318
Publisher: Institute of Physics
Year: 2008
Tongue: English
Weight: 431 KB
Volume: 19
Category: Article
ISSN: 0957-4484
DOI: 10.1088/0957-4484/19/25/255401

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