✦ LIBER ✦
Comparative study of tunneling currents through silicon dioxide and high-κ dielectric hafnium oxide partly embedded with nanocrystals and nanotubes in metal oxide semiconductor structures
✍ Scribed by Chakraborty, Gargi; Sarkar, C. K.
- Book ID
- 115481156
- Publisher
- American Institute of Physics
- Year
- 2008
- Tongue
- English
- Weight
- 505 KB
- Volume
- 104
- Category
- Article
- ISSN
- 0021-8979
No coin nor oath required. For personal study only.