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The robustness of series-connected high power IGBT modules

✍ Scribed by C. Abbate; G. Busatto; L. Fratelli; F. Iannuzzo; B. Cascone; R. Manzo

No coin nor oath required. For personal study only.

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Degradation behavior of 600 V–200&#

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Increasing the power of the high tempera

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Amplification of the power of a line tra

✍ A. N. Bastrikov; A. A. Zherlitsyn; A. A. Kim; B. M. Kovalchuk; S. V. Loginov; V. 📂 Article 📅 1999 🏛 Springer 🌐 English ⚖ 454 KB

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Variations in the parameters of scattere

✍ V. P. Burmaka; I. F. Domnin; V. P. Uryadov; L. F. Chernogor 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 851 KB