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Degradation behavior of 600 V–200 A IGBT modules under power cycling and high temperature environment conditions

✍ Scribed by M. Bouarroudj; Z. Khatir; J.P. Ousten; F. Badel; L. Dupont; S. Lefebvre


Book ID
108210729
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
838 KB
Volume
47
Category
Article
ISSN
0026-2714

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