The resistive switching characteristics in TaON films for nonvolatile memory applications

✍ Scribed by Chen, Min-Chen; Chang, Ting-Chang; Chiu, Yi-Chieh; Chen, Shih-Cheng; Huang, Sheng-Yao; Chang, Kuan-Chang; Tsai, Tsung-Ming; Yang, Kai-Hsiang; Sze, Simon M.; Tsai, Ming-Jinn

• Book ID: 121994476
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 984 KB
• Volume: 528
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/j.tsf.2012.09.081