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The Relationship Between Item Exposure and Test Overlap in Computerized Adaptive Testing

โœ Scribed by Shu-Ying Chen; Robert D. Ankenmann; Judith A. Spray


Book ID
111335504
Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
761 KB
Volume
40
Category
Article
ISSN
0022-0655

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