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Controlling item exposure and test overlap on the fly in computerized adaptive testing

✍ Scribed by Shu-Ying Chen; Pui-Wa Lei; Wen-Han Liao

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

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✍ Shu-Ying Chen; Robert D. Ankenmann; Judith A. Spray 📂 Article 📅 2003 🏛 John Wiley and Sons 🌐 English ⚖ 761 KB

Hypergeometric family and item overlap r

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