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The reason of degradation in electrical properties of ZnO:Al thin films annealed with various post-annealing temperature

✍ Scribed by Kim, Deok-Kyu; Kim, Hong Bae

Book ID: 122966848
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 886 KB
Volume: 13
Category: Article
ISSN: 1567-1739
DOI: 10.1016/j.cap.2013.08.008

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