Optical properties of post-annealed ZnO:Al thin films studied by spectroscopic ellipsometry

✍ Scribed by Y.H. Hwang; H.M. Kim; Y.H. Um; H.Y. Park

• Book ID: 119322477
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 738 KB
• Volume: 47
• Category: Article
• ISSN: 0025-5408
• DOI: 10.1016/j.materresbull.2012.04.111