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The range of validity of the Rayleigh and Thomson limits for Lorenz-Mie scattering

✍ Scribed by Kerker, Milton; Scheiner, Paul; Cooke, Derry D.

Book ID
115384419
Publisher
Optical Society of America
Year
1978
Weight
459 KB
Volume
68
Category
Article
ISSN
0030-3941

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Rayleigh-Mie scattering ellipsometry as
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## Abstract We have utilised __in situ__ Rayleigh–Mie scattering ellipsometry to analyse the growth process of amorphous hydrogenated carbon nitride (a‐C:H:N) nanoparticles synthesised in a plasma of nitrogen and acetylene. The validity of the measurements is shortly discussed. The complex refracti