Rayleigh-Mie scattering ellipsometry as anin situdiagnostic for the production of “smart nanoparticles”
✍ Scribed by Weiß, Raphaela ;Hong, Suk-Ho ;Ränsch, Jens ;Winter, Jörg
- Book ID
- 105364772
- Publisher
- John Wiley and Sons
- Year
- 2008
- Tongue
- English
- Weight
- 590 KB
- Volume
- 205
- Category
- Article
- ISSN
- 0031-8965
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✦ Synopsis
Abstract
We have utilised in situ Rayleigh–Mie scattering ellipsometry to analyse the growth process of amorphous hydrogenated carbon nitride (a‐C:H:N) nanoparticles synthesised in a plasma of nitrogen and acetylene. The validity of the measurements is shortly discussed. The complex refractive indices in dependence of the particle radius are carefully determined and compared with a‐C:H(:N) films which are deposited under similar conditions and analysed via multiple wavelength ellipsometry. Internal structures of the nanoparticles are then deduced from the change of optical constants during the growth. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)