Characterization of reactive DC magnetro
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B. Subramanian; K. Ashok; P. Kuppusami; C. Sanjeeviraja; M. Jayachandran
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Article
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2008
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John Wiley and Sons
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English
β 180 KB
## Abstract Thin films of about 1ΞΌm Titanium Aluminum Nitride (TiAlN) were deposited onto mild steel substrates by reactive direct current (DC) magnetron sputtering using a target consisting of equal segments of titanium and aluminum. Xβray diffraction (XRD) analysis showed that the TiAlN phase had