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The process window of a-Si/Ti bilayer metallization for an oxidation-resistant and self-aligned TiSi2 process

✍ Scribed by Lou, Y.-S.; Win, C.-Y.; Cheng, H.-C.


Book ID
114534684
Publisher
IEEE
Year
1992
Tongue
English
Weight
951 KB
Volume
39
Category
Article
ISSN
0018-9383

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