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The preparation and refractive index of BST thin films

✍ Scribed by S.Z. Li; Y.Q. Yang; L. Liu; W.C. Liu; S.B. Wang


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
277 KB
Volume
403
Category
Article
ISSN
0921-4526

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Determination of the refractive index and the thickness of thin-films using light interference have been presented. This has been done, for the first time, with the use of LloydΓ•s interferometer. The mean idea is based on using the sample in two different positions in the same interferometer. The me