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On the dispersion of the refractive index in AIIBVI thin films

✍ Scribed by Dr. M. Łepek

Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
148 KB
Volume
23
Category
Article
ISSN
0232-1300

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Optical investigations of self-polarized PbZr 0.235 Ti 0.765 O 3 (PZT) films deposited onto Si/SiO 2 /adhesion layer/(111) Pt substrate by RF sputtering are presented in this work. Measurements were performed with a spectral ellipsometer working in rotating analyzer mode. To obtain the temperature d