Photorefractive Beam-Coupling Measurement of the Nonlinear Refractive Index of Semiconductor Films

✍ Scribed by H. Garcia; A.M. Johnson; Sudhir Trivedi

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 98 KB
• Volume: 220
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/1521-3951(200007)220:1<47::aid-pssb47>3.0.co;2-u