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The polarized neutron reflectivity and X-ray reflectivity studies of the magnetic profiles of epitaxial Ni80Fe20/Ru multilayers

✍ Scribed by Hui-Chia Su; Jinn-Jer Peir; Chih-Hao Lee; Ming-Zhe Lin; Po-Tsang Wu; J.C.A. Huang; Zin Tun

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 407 KB
Volume: 357
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2004.11.026

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✦ Synopsis

The depth profiles of the epitaxial Ni 80 Fe 20 (1 1 1)/Ru(0 0 0 1) multilayers were studied by polarized neutron reflectivity and X-ray reflectivity. At the Ru thickness that the anti-ferromagnetic coupling was found, the magnetic moments between two Ni 80 Fe 20 interlayers show a biquadratic coupling effect with a double unit cell at low applied fields. A magnetic dead layer of about 0.3 nm was also found at the interface boundaries. The maximal polarization effect applied to the Ru layer is less than 0.03m B .

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