The formation of grains in thin films generates intrinsic residual stress. In this work, we present a model of intrinsic residual stress calculation based on the size-dependent phase transitions of the nanograins. Evaporated thin films are produced by condensation from the vapor on the substrate. It
โฆ LIBER โฆ
The origins of stress in thin nickel films
โ Scribed by F.A. Doljack; R.W. Hoffman
- Publisher
- Elsevier Science
- Year
- 1972
- Tongue
- English
- Weight
- 214 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0040-6090
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