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The optical absorption edge of amorphous thin films of silicon monoxide and of silicon monoxide mixed with titanium monoxide

โœ Scribed by M. Ilyas; C. A. Hogarth

Publisher
Springer
Year
1983
Tongue
English
Weight
140 KB
Volume
2
Category
Article
ISSN
0261-8028

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Titanium monoxide films of about 100 mm thickness have been deposited onto Si (100) by reactive ion beam deposition. The established experimental conditions provided reproducibility of synthesised films. With a fcc cubic structure and a lattice parameter of 4.17 A หš, as found by X-ray diffraction ;