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The nanostructural analysis of hydrogenated silicon films based on positron annihilation studies

✍ Scribed by J. Melskens; A.H.M. Smets; S.W.H. Eijt; H. Schut; E. Brück; M. Zeman


Book ID
119301133
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
699 KB
Volume
358
Category
Article
ISSN
0022-3093

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