The Microstructure of Ti/Al and TiN Ohmic Contacts to Gallium Nitride

✍ Scribed by Ruterana, P. ;Nouet, G. ;Kehagias, Th. ;Komninou, Ph. ;Karakostas, Th. ;di Forte Poisson, M. A. ;Huet, F. ;Morkoc, H.

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 331 KB
• Volume: 176
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/(sici)1521-396x(199911)176:1<767::aid-pssa767>3.0.co;2-r