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The microstructure and electrical properties of contacts formed in the Ni/Al/Si system due to rapid processing: A Katz and Y Komem, J appl Phys, 63, 1988, 5526–5533


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
156 KB
Volume
39
Category
Article
ISSN
0042-207X

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