Atomic force microscopy of local complia
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S.J. O'Shea; M.E. Welland; J.B. Pethica
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Article
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1994
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Elsevier Science
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English
โ 496 KB
A modified atomic force microscope ( AFM ) is used to directly measure the local compliance of ordered liquid layers at solidliquid interfaces. Measurements of the compliance of the solvation structure for octamethylcyclotetrasiloxane and n-dodecanol near graphite and mica surfaces are presented. We