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The method of parallel-sequential built-in self-testing in integrated circuits of the type SFPGAS

✍ Scribed by G. P. Aksenova; V. F. Khalchev

Book ID: 110152486
Publisher: SP MAIK Nauka/Interperiodica
Year: 2007
Tongue: English
Weight: 283 KB
Volume: 68
Category: Article
ISSN: 0005-1179
DOI: 10.1134/s0005117907010146

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