✦ LIBER ✦

The measurement of grain boundary thickness using X–ray diffraction techniques

✍ Scribed by Budai, J.; Gauddig, W.; Sass, S. L.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Thickness measurement of GaN epilayer us

✍ Gan Feng; Jianjun Zhu; Xiaoming Shen; Baoshun Zhang; Degang Zhao; Yutian Wang; H 📂 Article 📅 2003 🏛 Science in China Press (SCP) 🌐 English ⚖ 263 KB

Stress measurement by X–ray diffraction

✍ K. W. ANDREWS; J. C. GREGORY; D. BROOKSBANK 📂 Article 📅 1974 🏛 John Wiley and Sons 🌐 English ⚖ 545 KB

Novel X-ray diffraction microscopy techn

✍ J.M. Yi; J.H. Je; Y.S. Chu; W.G. Cullen; H. You 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 257 KB

Measurement of thin film piezoelectric c

✍ Yu, Y H; Lai, M O; Lu, L 📂 Article 📅 2007 🏛 Royal Swedish Academy of Sciences 🌐 English ⚖ 413 KB

An x-ray diffraction study of grain boun

✍ Raymond Morgan; Sylvia Steckler; E.B. Schwartz 📂 Article 📅 1940 🏛 Elsevier Science 🌐 English ⚖ 416 KB

Grain size measurement of nanocrystallin

✍ T. Inami; M. Kobiyama; S. Okuda; H. Maeta; H. Ohtsuka 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 283 KB