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Measurement of thin film piezoelectric constants using x-ray diffraction technique

✍ Scribed by Yu, Y H; Lai, M O; Lu, L

Book ID: 120582991
Publisher: Royal Swedish Academy of Sciences
Year: 2007
Tongue: English
Weight: 413 KB
Volume: T129
Category: Article
ISSN: 0031-8949
DOI: 10.1088/0031-8949/2007/T129/078

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