The loss of X-ray intensity due to backscattering of electrons in microanalyser targets
โ Scribed by G. Springer
- Publisher
- Springer
- Year
- 1966
- Tongue
- English
- Weight
- 396 KB
- Volume
- 54
- Category
- Article
- ISSN
- 0026-3672
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๐ SIMILAR VOLUMES
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## Abstract We evaluated and measured the influence of channelling on changes in intensity of the characteristic lines and background of Auger electron spectra by performing calculations and experiments on an aluminium single crystal. Propagation of the incident beam in the crystal was calculated