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The local structure of porous silicon studied by EXAFS

โœ Scribed by G. Dalba; P. Fornasini; M. Grazioli; R. Grisenti; Y. Soldo; F. Rocca


Book ID
113284845
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
391 KB
Volume
97
Category
Article
ISSN
0168-583X

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The local structure of porous silicon in
โœ G. Dalba; P. Fornasini; M. Grazioli; R. Grisenti; Y. Soldo; F. Rocca ๐Ÿ“‚ Article ๐Ÿ“… 1995 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 175 KB

X-ray absorption measurements at the K-edge of silicon have been done in transmission mode on three powdered samples of porous silicon (p-Si) with 50%, 65% and 80% porosity, prepared by decreasing the HF content in the anodic solution. The analysis of EXAFS reveals a crystal-like structure of p-Si a

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