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Local structure of porous silicon

✍ Scribed by SC Bayliss; DA Hutt; Q Zhang; N Danson; A Smith


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
376 KB
Volume
91
Category
Article
ISSN
0038-1098

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The work demonstrates that the surface atom layers of variously-prepared samples of porous silicon can, after high-temperature heat treatment in high vacuum, yield low energy electron diffraction patterns and also atomic resolution in scanning tunneling microscopy. The (100) surfaces show some patch