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The Jump-to-Contact Distance in Atomic Force Microscopy Measurement

✍ Scribed by Wu, Jiunn-Jong

Book ID: 127136585
Publisher: Taylor and Francis Group
Year: 2010
Tongue: English
Weight: 488 KB
Volume: 86
Category: Article
ISSN: 0021-8464
DOI: 10.1080/00218464.2010.519256

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