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On the tip calibration for accurate modulus measurement by contact resonance atomic force microscopy

✍ Scribed by Passeri, D.; Rossi, M.; Vlassak, J.J.

Book ID: 121180975
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 746 KB
Volume: 128
Category: Article
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2013.02.003

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