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The Influence of Various Parameters on the Refractive Index of Evaporated Dielectric Films

โœ Scribed by Heitmann, Walter


Book ID
115320507
Publisher
The Optical Society
Year
1968
Tongue
English
Weight
368 KB
Volume
7
Category
Article
ISSN
1559-128X

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The influence of various dielectric para
โœ J.A.A. Engelbrecht; I.J. van Rooyen ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 333 KB

The reststrahlen region of SiC is analysed with the goal of establishing the origin of different shapes of this band, by varying the dielectric parameters involved when simulating the reststrahlen region as obtained by infrared reflectance.