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The Influence of the Completeness of the Data Set on the Charge Density Obtained with the Maximum-Entropy Method. A Re-examination of the Electron-Density Distribution in Si

โœ Scribed by Takata, M. ;Sakata, M.


Book ID
114513898
Publisher
International Union of Crystallography
Year
1996
Tongue
English
Weight
428 KB
Volume
52
Category
Article
ISSN
0108-7673

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Nd2\_xCexCuO4\_6 single crystals have been studied using X-ray diffraction data. The investigations have been carried out on a non-doped crystal of Nd2CuO4 and Ce doped crystals of Nd2\_xCexCuO4\_6. From the structure parameters obtained, the deformation electron density distribution has been determ