The Influence of Tape Arrangements on the Critical Current of Bi-2223 Superconducting Current Leads
β Scribed by Qu, T.-M.; Gu, C.; Li, X.-F.; Zhao, L.; Li, P.; Zhang, H.-J.; Han, Z.
- Book ID
- 121825339
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 260 KB
- Volume
- 17
- Category
- Article
- ISSN
- 1051-8223
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
The effect of sweep rate of applied current (dI/dt) on critical current (I c ) of Ag-sheathed Bi 2 Pb x Sr 2-x Ca 2 Cu 3 O y (Ag-Bi-2223) tapes was studied by the four-probe measurement method of V-I curves. It was found that the V-I curves were affected apparently by dI/dt, resulting I c , decrease
As the stress-induced damage evolution is different from position to position in the sample, the local critical current is scattered in a sample, affecting on the overall current. The present work aimed to describe the distribution of local critical current and its relation to overall critical curre