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Statistical analysis of scatter in critical current of bent superconducting Bi2223 composite tape

✍ Scribed by S. Ochiai; M. Fujimoto; J.K. Shin; H. Okuda; M. Hojo; K. Osamura; T. Kuroda; K. Itoh; H. Wada

Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
652 KB
Volume
463-465
Category
Article
ISSN
0921-4534

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