The influence of ferroelectric–electrode interface layer on the electrical characteristics of negative-capacitance ferroelectric double-gate field-effect transistors

✍ Scribed by Yongguang Xiao; Minghua Tang; Jiancheng Li; Bo Jiang; John He

• Book ID: 113800630
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 449 KB
• Volume: 52
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2011.11.006