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The impact of process-induced mechanical stress in narrow width devices and variable-taper CMOS buffer design

✍ Scribed by Alam, Naushad; Anand, Bulusu; Dasgupta, S.

Book ID: 122429637
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 636 KB
Volume: 53
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2013.01.004

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