The impact of high-kgate dielectric and FIBL on performance of nano DG-MOSFETs with underlapped source/drain regions

✍ Scribed by Charmi, Morteza; Mashayekhi, Hamid R.; Orouji, Ali A.

• Book ID: 121546699
• Publisher: Springer
• Year: 2013
• Tongue: English
• Weight: 431 KB
• Volume: 13
• Category: Article
• ISSN: 1569-8025
• DOI: 10.1007/s10825-013-0528-x