The impact of electrical current, mechanical bending, and thermal annealing on tin whisker growth

✍ Scribed by Yuki Fukuda; Michael Osterman; Michael Pecht

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 186 KB
• Volume: 47
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2006.04.011