The Ge Stranski-Krastanov growth mode on Si(01)(2 x 1) tested by X-ray photoelectron and Auger electron diffraction

✍ Scribed by M. Diani; D. Aubel; J.L. Bischoff; L. Kubler; D. Bolmont

• Book ID: 104198347
• Publisher: Elsevier Science
• Year: 1993
• Weight: 77 KB
• Volume: 291
• Category: Article
• ISSN: 0167-2584
• DOI: 10.1016/0167-2584(93)90292-q