Ge segregation tested by X-ray photoelectron diffraction and surface atom titration during the first stage of Si heteroepitaxy on Ge(001)2 × 1

✍ Scribed by D. Aubel; L. Kubler; J.L. Bischoff; D. Bolmont

• Book ID: 116067836
• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 518 KB
• Volume: 352-354
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/0039-6028(95)01218-4