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The fluence effect in hydrogen-ion cleaving of silicon at the sub-100-nm scale

โœ Scribed by O. Moutanabbir; B. Terreault; M. Chicoine; F. Schiettekatte


Publisher
Springer
Year
2004
Tongue
English
Weight
842 KB
Volume
80
Category
Article
ISSN
1432-0630

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