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The Film Gains a Dimension

✍ Scribed by Jack Howard


Book ID
124292643
Publisher
University of California Press
Year
1952
Weight
213 KB
Volume
7
Category
Article
ISSN
1549-0068

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The applicability of models based on fractal geometry to characterize thin-Ðlm surfaces was investigated. The fractal geometry of sputtered chromium nitride and silicon nitride thin-Ðlm surfaces was described using Fourier spectral analysis of proÐles from scanning tunnelling microscopy images and a