✦ LIBER ✦

The expression correction of transistor current gain and its application in reliability assessment

✍ Scribed by Qi, Haochun; Zhang, Xiaoling; Xie, Xuesong; Zhao, Li; Chen, Chengju; Lü, Changzhi

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Noise in high-gain transistors and its a

✍ Hsu, S.T. 📂 Article 📅 1971 🏛 IEEE 🌐 English ⚖ 621 KB

Transport equations in heavily doped sil

✍ M.S. Mock 📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 755 KB

The collapse of current gain in multi-fi

✍ Liu, W.; Khatibzadeh, A. 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 988 KB

The two-dimensional model for the base s

✍ Zhao Cezhou; Zhang Desheng; Shi Baohua 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 264 KB

Strengths and weaknesses in the current

✍ Friend, Stephen 📂 Article 📅 1999 🏛 Nature Publishing Group 🌐 English ⚖ 62 KB

Inverse modeling and its application in

✍ Hyungkeun Ahn; El Nokali, M.A. 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 673 KB