The evaluation of CMOS static-charge protection networks and failure mechanisms associated with overstress conditions as related to device life: L. J. Gallace and H. L. Pujol 15th A. Proc. Reliab. Phys. IEEE, Nevada, p.149 (1977)

• Book ID: 108361035
• Publisher: Elsevier Science
• Year: 1980
• Tongue: English
• Weight: 144 KB
• Volume: 11
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(80)80117-0