✦ LIBER ✦
The evaluation of CMOS static-charge protection networks and failure mechanisms associated with overstress conditions as related to device life : L. J. Gallace and H. L. Pujol. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 149
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 128 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0026-2714
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