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The electron spectra of beryllium and beryllium oxide: an XPS, X-AES and AES study

โœ Scribed by Mallinson, Christopher F.; Castle, James E.; Watts, John F.


Book ID
121785874
Publisher
John Wiley and Sons
Year
2014
Tongue
English
Weight
297 KB
Volume
46
Category
Article
ISSN
0142-2421

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XPS and x-ray-induced AES have been used to study the reaction layers formed on silicon powder samples heated in ultra-high purity nitrogen at temperatures between 1100 and 1200 "C. An equation was derived to calculate the average surface reaction layer thicknesses from the silicon AES spectra. The