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The electrical properties of zinc in silicon

✍ Scribed by S. Weiss; R. Beckmann; R. Kassing


Publisher
Springer
Year
1990
Tongue
English
Weight
486 KB
Volume
50
Category
Article
ISSN
1432-0630

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## Abstract We present results of the electrical properties of gold‐decorated dislocations in silicon studied by means of Deep Level Transient Spectroscopy (DLTS). We investigated the effect of the gold by measuring DLTS spectra from Schottky diodes having different gold concentrations but same the