The electrical characterization of ceramic oxides
β Scribed by A.D. Brailsford; D.K. Hohnke
- Book ID
- 104199728
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 742 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0167-2738
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π SIMILAR VOLUMES
The electrical properties of low temperature (150 Β°C) plasma deposited TiO 2 gate dielectrics on strained-Si are reported. The deposited films have been analyzed by X-ray photoelectron spectroscopy for chemical composition. The interfacial and electrical properties of the deposited films have been c
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