A ¨ibrating metallic conical probe has been used in near-field microscopic measurements to obtain optical resolutions much smaller than the wa¨elength. Numerical simulations of these complex problems ha¨e drawn most of the attention in the past. We propose here an analytical expression for the elect
The electric field at the apex of a near-field probe: implications for nano-Raman spectroscopy
✍ Scribed by H. D. Hallen; C. L. Jahncke
- Publisher
- John Wiley and Sons
- Year
- 2003
- Tongue
- English
- Weight
- 196 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0377-0486
- DOI
- 10.1002/jrs.1048
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